IROC Technologies delivers a full chain of soft error analysis; from radiation testing on real silicon to design-level simulation using our advanced EDA tools – TFIT® (cell-level) and SoCFIT® (SoC-level) soft error analysis and mitigation solution.

Our colleague Maximilien Glorieux is presenting our poster at DAC 2025!
– Session Title: Soft Error Simulation Tools, From 45nm to 3nm
– Today 5:00 PM – 6:00 PM
– Session Room: Level 2 Exhibit Hall Engineering Poster Gallery

He will be happy to share how invisible radiation particles can cause critical system failures and how IROC’s solutions help reduce their impact.

Let’s talk about how we support high-reliability applications with our unique expertise in soft error analysis and radiation effects.