Overview
Alpha Particles Attenuation to Propagation (A2P) EDA software predicts the flux and spectrum of alpha particles, originating in the device packaging and impacting the sensitive parts of a SoC, with a fast and accurate 3D simulation tool. It allows to easily analyze the contributions of the different layers of contaminated materials.
- Simulate the 3D Monte Carlo simulation of alpha particle emissions within polluted materials
- Perform the 3D propagation of alpha particles though the device
- Analyze the alpha particles spectrum and flux at the transistor level, considering shielding and attenuation effects in the device
- Embed Geant4, a leading simulator for particle and nuclear physics
- Simple XML description of the material layers stack and the emissivity of polluted layers
- Support 3 natural nuclear decay chains that cause material pollution: U238, U235, Th232
Main use
- Evaluate the flux and spectrum of alpha particles reaching transistors
- Analyze internal shielding performance against emissions of the most polluted materials in circuit (e.g., solder balls)
- Measure the precise flux of alpha particles at the transistor level
- Assess LET/Energy spectra of alpha particles at transistor locations
- Calculate the Alpha FIT of an SoC in alpha cross-section mode with seamless integration into TFIT®, IROC’s EDA tool
Inputs and outputs

Reported results

Example of Geant4 simulation of the propagation of alpha particles emitted in a small volume of CU

Alpha particles spectrum in energy at transistors location

LET sspLETAlpha particles spectrum in LET at transistors location
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SoCFIT - unique SoC level soft error analysis and mitigation
SoCFIT - unique SoC level soft error analysis and mitigation
SoCFIT - unique SoC level Soft Error analysis and mitigation, system level Soft Error analysis and mitigation - IROC TECHNOLOGIES