IROC’s latest article on Semiwiki

IROC Technologies specializes in soft error analysis and mitigation. We dive into the critical world of radiation’s impact on semiconductor reliability. Our latest article on Semiwiki discusses the increasing importance of Single Event Effects (SEE) in chip design, packaging, and the profound impact on product reliability and failure rates.

The impact of SEEs on a variety of applications, from satellite launch failures to real-world elections, is enormous. This isn’t just an issue limited to space or avionics. It affects our daily lives more than we think.

Please check out the full article here: