IROC Technologies recently received feedback from a customer developing a radiation-hardening solution for Low Earth Orbit (LEO) and Medium Earth Orbit (MEO), using our EDA tools: TFIT® for cell-level soft error analysis and SoCFIT® for system-level evaluation.

Their key challenge was “improving reliability without compromising performance”.

TFIT, they were able to efficiently assess cell-level Soft Error Rate (SER):
– Automated state analysis
– Multi Cell Upset (MCU) simulation for realistic radiation effects

SoCFIT, they highlighted:
– Clear workflows and optimized scripts
– Fast simulation enabling quick iterations

The result: enabling more confident and informed hardening decisions from cell to system level, early in the design phase!

By shifting soft error analysis upfront, they could significantly reduce costly late-stage iterations and minimize the need for extensive radiation testing, ultimately accelerating time-to-market (TTM) and optimizing development costs.

If you’re working on soft error challenges in space or other high-reliability applications, feel free to reach out.