IROC Technologies successfully completed its neutron beam testing last week at the ILL – Institut Laue-Langevin in Grenoble.

Our SERTEST team has conducted advanced radiation testing using neutron beams to analyze the radiation effects on semiconductor devices to ensuring their reliability in critical applications.

Our next test campaign will be at the ISIS Neutron and Muon Source in the UK. If you’re interested in any radiation testing for your devices, feel free to reach out at info@iroctech.com.