For the semiconductor businesses facing Soft Error issues, iRoC Technologies is the independent expert and advisor providing radiation test services and EDA tools to measure, predict and solve these reliability problems.

Soft Errors, caused mainly by cosmic rays and alpha particles from the chip packaging are affecting electronic systems in advanced CMOS technologies increasingly as process node scales down (90nm, 65nm, 40nm and beyond). Such reliability issues creates tangible business risk: product recall, loss of market opportunity, loss of goodwill and trust from customers, liabilities of all sorts.

With 11 years of experience in the field, iRoC's tools and experts help diagnose and solve the issues with the following:

  • Cell level and circuit level EDA tools
  • Accelerated tests for standalone components and systems using neutrons, alpha particles, protons and heavy ions.
  • Alpha particles counting for packaging materials
  • Soft Error Rate Library characterization
  • Soft Error Rate protection expertise

    • For more information please contact us

NEWS RELEASES

DFT 2011
E.Costenaro presents:"A practical Approach to Single Event Transients Analysis for Highly Complex Design"
Abstract

TSMC Open Innovation Platform Ecosystem Forum
Visit iRoC booth #701 at San Jose Conference Center on October 18th 2011.

RADECS 2011
iRoC co-author with EADS of:"Assessment and comparison of the low energy proton sensitivity in 65nm to 28nm SRAM devices"
Abstract

IOLTS 2011
Dr.Alexandrescu to present:
"A New IP Core for Fast Error Detection and Fault Tolerance in COTS-based Solid State Mass Memories", E.Costenaro, M.Violante (Politecnico di Torino), D.Alexandrescu (iRoC)
Abstract

"A Comprehensive Soft Error Analysis Methodology for SoCs/ASICs Memory Instances" Abstract


Software Licensing Piracy Protection