For the semiconductor businesses facing Soft Error issues, iRoC Technologies is the independent expert and advisor providing radiation test services and simulation tools to measure, predict and solve these reliability problems.

Soft Errors, caused mainly by cosmic rays and alpha particles from the chip packaging are affecting electronic systems in advanced CMOS technologies (90nm and beyond). Such reliability issues creates tangible business risk: product recall, loss of market opportunity, loss of goodwill and trust from customers, liabilities of all sorts.

With 10 years of experience in the field, iRoC's experts help diagnose and solve the issues, using the following:

  • Accelerated tests for standalone components and systems using neutrons, alpha particles, protons and heavy ions.
  • Alpha particles counting for packaging materials
  • Pre-Silicon ASIC Assessment through simulation
  • Soft Error Rate Library characterization
  • Soft Error Rate protection expertise
  • Cell level and circuit level analysis tools

iRoC MANAGEMENT STATEMENT

Los Alamos Anual Report
Check this article on SER at Los Alamos labs:
"WNR helps solve new reliability challenges on electronic devices"

SER: Am I at risk?
Watch this tutorial to understand the SER threat to your product and take action.

Software Licensing Piracy Protection