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For the semiconductor businesses facing Soft Error issues, iRoC
Technologies is
the independent expert and advisor providing radiation test
services
and simulation tools to measure, predict and solve these reliability
problems.
Soft Errors, caused mainly by cosmic rays and alpha particles from the
chip packaging are affecting electronic systems in advanced CMOS
technologies (90nm and beyond). Such reliability issues creates
tangible business risk: product recall, loss of market opportunity,
loss of goodwill and trust from customers, liabilities of all sorts.
With 10 years of experience in the field, iRoC's
experts help diagnose and solve the issues, using the following:
- Accelerated tests for standalone components and systems using neutrons, alpha particles, protons and heavy ions.
- Alpha particles counting for packaging materials
- Pre-Silicon ASIC Assessment through simulation
- Soft Error Rate Library characterization
- Soft Error Rate protection expertise
- Cell level and circuit level analysis tools
iRoC MANAGEMENT STATEMENT
As experts in soft error analysis and testing,
iRoC is committed to the highest level of integrity and effectivness in
its way of doing
business. We will only report facts that have been confirmed internally
by our test or analysis activities.
Los Alamos
Anual Report
Check this article on SER at Los Alamos labs:
"WNR helps solve new reliability
challenges on electronic devices"
SER: Am I at
risk?
Watch
this tutorial to understand the SER threat to your product and take
action.