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The IROC difference

The Standard for Soft Error Prevention

Electronic devices are constantly exposed to natural radiations. This can lead to single event effect (SEE) at any time. SEE cause unpredictable system behavior and threaten safety and reliability. This threat is increasing with small geometries. We are experts in

  • Solutions to anticipate complex reliability issues
  • Helping designers anticipate and solve soft error issues
  • Characterizing silicon reliability performances

News Room

Press-  New papers added


Press-  New blog post: The business of System Reliability


Events-  iROC @ DAC 2014


Events-  TSMC 2014 NA Technology Symposium


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