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The IROC difference

The Standard for Soft Error Prevention

https://www.youtube.com/watch?v=yjgZdt0z5Y0

 

Electronic devices are constantly exposed to natural radiations. This can lead to single event effect (SEE) at any time. SEE cause unpredictable system behavior and threaten safety and reliability. This threat is increasing with small geometries and there is not one easy and cost effective solution to solve the issue.  IROC engineers are experts in

  • Solutions to anticipate complex reliability issues
  • Helping designers anticipate and solve soft error issues
  • Characterizing silicon reliability performances

News Room

Press-  ELESIS Project

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Press-  IROC releases TFIT v.4.0

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Events-  IOLTS 2014

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Press-  Video interview with EDACafe at DAC 2014

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Press-  New Paper: Debunk Soft Error Myths

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Press-  New papers added

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Press-  New blog post: The business of System Reliability

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