Our Soft Error Tools

• TFIT — Soft error simulation tool at transistor level for library designers
• SOCFIT — Soft error simulation tool at circuit level for chip architect

Our Foundry Partners

Our Services

• Radiation testing
  for chips and systems
• Alpha counting
  for wafers and materials
• SER Diagnosis and Mitigation
  for cell and circuit

The IROC difference

The Standard for Soft Error Prevention

Electronic devices are constantly exposed to natural radiations. This can lead to single event effect (SEE) at any time.

SEE cause unpredictable system behavior and threaten safety and reliability. This threat is increasing with small geometries.

We are experts in

• Solutions to anticipate complex
  reliability issues
• Helping designers anticipate and
  solve soft error issues
• Characterizing silicon reliability
  performances