September 17 2015 – TSMC 2015 OIP
Location: Santa Clara,CA, USA
Time 8:00 – 6:00 pm
- IROC will exhibit at OIP
http://www.hwacomms.com/TSMC2015/OIP/Partner/index.php
The TSMC Open Innovation Platform® (OIP) Ecosystem Forum is a one-of-a-kind event that brings together the semiconductor design chain community and approximately 1,000 of director-level and above TSMC customer executives. The OIP Forum will feature a day-long, three-track technical conference along with an Ecosystem Pavilion that will host up to 80 member companies
August 11-13 2015 – Flash Memory Summit
Location: Santa Clara,CA, USA
http://www.flashmemorysummit.com/
July 6-8, 2015 – IOLT 2015
21st IEEE International On-Line Testing Symposium
Location: Athena Pallas Village, Elia, Halkidiki, Greece
http://tima.imag.fr/conferences/iolts/iolts15/
June 8-10, 2015 – DAC 2015
Location: Moscone Center, San Francisco, CA, USA
- IROC will exhibit at Booth # 2123
April 19-23, 2-2015 – IEEE International Reliability Physics Symposiums
Location: Monterrey, CA, USA
IROC presented a Tutorial and a paper
March 19th, 2015 – IEEE International Reliability Innovations Conference
- Location: San Jose, CA, USA
- IROC supports the conference
September 30th, 2014 – TSMC 2014 Open Innovation Platform
- Location: San Jose, CA, USA
- IROC will exhibit at Booth # 315
June 1-5, 2014 – DAC 2014
- Location: San Francisco, CA, USA
- IROC will exhibit at Booth # 817
April 22, 2014 – TSMC 2014 NA Technology Symposium
- Location: San Jose, CA, USA
- IROC will exhibit at Booth # 404
March 19, 2014 – IEEE International Reliability Innovation Conference (IRIC)
- Location: San Jose, CA, USA
- IROC presented a paper titled “Supply Chain Management for Reliability: Identifying SER-critical components in a large system-Bill Of Material”
March 4-6, 2013 – ISQED
- Location: Santa Clara, CA, USA
- IROC’s Adrian Evans published a paper “Clustering Techniques and Statistical Fault Injection for Selective Mitigation of SEUs in Flip-Flops.” For more information, click here
March 7, 2013 – IEEE International Reliability Innovations Conference (IRIC)
- Location: San Jose, CA, USA
- IROC’s Enrico Costenaro, Adrian Evans, and Dan Alexandrescu published a paper “Subtleties of Single Event Upset Analysis and Mitigation in Sequential Cells.” For more information, click here
March 18-22, 2013 – DATE 2013
- Location: Grenoble, France
- IROC participated in following sessions:
Fringe Meeting: “Challenges in Design and Qualification for Automotive Electronics” (here)
1st RIIF Workshop – Towards Standards for Specifying and Modeling the Reliability of Complex Electronic Systems (here)
- Location: Stanford University, Palo Alto, CA USA
- IROC participated in Selse-9 as a sponsor as well as a presenters.
- Location: San Jose McEnery Convention Center
- IROC exhibited at the TSMC Technology Symposium
- Location: Berkeley, CA, USA
- IROC presented the session on Standards-Based Approaches to Reliability Analysis on April 29th (more)
June 2-6, 2013 – DAC 2013
- Location: Austin, TX, USA (Booth # 1738)
- iROC exhibited and presented a poster at Designer Track
July 8-12, 2013 – IEEE The Nuclear and Space Radiation Effects Conference (NSREC)
- Location: San Francisco, CA, USA (Booth #309)
- IROC exhibited at IEEE/NSREC 2013 on 9th and 10th. For more information, click here
July 8-10, 2013 – IEEE On-Line Testing Symposium (IOLTS)
- Location: Crete, Greece
- IROC’s Dan Alexandrescu is a program chair at IOLTS. For more information, click here
October 1, 2013 – TSMC 2013 Open Innovation Platform® (OIP) Ecosystem Forum
- Location: San Jose, CA, USA (Booth #314)