News

07/12/2023

IROC Technologies is very pleased and thankful to participate in the 2023 IRT Nanoelec AG on November 14 in Grenoble.

05/12/2023

IROC Technologies is excited to introduce our new teammates, Mohamed KHALDOUNI!

05/12/2023

Issam NOFAL speak on ‘Soft-Errors Analysis and Mitigation Framework’

05/12/2023

IROC Technologies SERTEST team will be at ISIS-ChipIr (UK).

05/12/2023

IROC Technologies has participated in TSMC OIP Nanjing 2023.

05/12/2023

Our latest article on Semiwiki discusses the increasing importance of Single Event Effects (SEE) in chip design, packaging, and the profound impact on product reliability and failure rates.