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Site Redesign

Dear IROC Partners and Customers, Welcome! We’ve just redesigned our site. Hope you’ll like it! Many updates still ongoing. Please bear with us for a few more days. We plan to add a lot of ressources related to microelectronics reliability, dependability and much more.

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SELSE-12: The 12th Workshop on Silicon Errors in Logic – System Effects – March 29 – March 30, 2016 – Austin TX

IROC is sponsoring the 12th edition of SELSE. Together with Intel’s Helia Naeimi, Dan Alexandrescu is the General Co-Chair of this year’s SELSE. The growing complexity and shrinking geometries of modern manufacturing technologies are making high-density, low-voltage devices increasingly susceptible to the influences of electrical noise, process […]

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Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems – March 18th 2016 – Dresden, Germany

IROC is co-organizing the ERMAVSS Workshop. Together with  Stefano di Carlo (Politecnico di Torino – IT), Praveen Raghavan (IMEC – BE) and Dimitris Gizopoulos (University of Athens – GR), IROC’s Adrian Evans is the General Chair Co-Chair With the proliferation of integrated circuits implemented in the most advanced process technologies, […]

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Computing Now – Are Our Electronic Circuits Getting Older? – September 2015

Link to Enabling Lifetime Performance – by Dan Alexandrescu There are many interesting challenges associated to the aging of semiconductor devices. The industry and its R&D partners needs a very good understanding of the phenomena, the supporting EDA infrastructure and efficient solutions to implement advanced self-tuning […]

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