Your Functional Reliability Partner – IROC Technologies
+33 438 120 763 (FR)
+1 408 982 9993 (US)
info@iroctech.com
Contact Us
Support Site

Archive for the News Category

IROC at NSREC

From July 12th to 15th, IROC will be participating  presenting an oral paper at the NSREC conference in Portland Oregon. Maximilien Glorieux will present a joint paper with ST Micro Electronics titled “Detailed SET Measurement and Characterization of a 65 nm Bulk Technology” which highlights advanced techniques for […]

Read more

System-to-Silicon Performance Modeling and Analysis Workshop at DAC

IROC will be participating in the System-to-Silicon Performance Modeling and Analysis – Power, Temperature and Reliability workshop at DAC, in Austin on Sunday June 5th. Come hear our talk on “Modeling of Variability and Aging Effects Across Abstraction Layers” including the latest updates from the MoRV FP7 Research Project.

Read more

IROC at SEE Symposium / MAPLD

IROC will participating in the SEE Symposium MAPLD on May 23rd in La Jolla, California. During a keynote talk by Adrian Evans, we will present the results of a detailed study of Single Event Transients (SETs) in a 65nm space technology, including novel new techniques for measuring […]

Read more

IROC at DAC

IROC is excited to showcase its products, technologies and services at the 53rd Design Automation Conference in Austin. Come by and meet us at booth 1638 to find out about our radiation test services and to learn about the latest advances in our reliability tools (TFIT and […]

Read more

Site Redesign

Dear IROC Partners and Customers, Welcome! We’ve just redesigned our site. Hope you’ll like it! Many updates still ongoing. Please bear with us for a few more days. We plan to add a lot of ressources related to microelectronics reliability, dependability and much more.

Read more

SELSE-12: The 12th Workshop on Silicon Errors in Logic – System Effects – March 29 – March 30, 2016 – Austin TX

IROC is sponsoring the 12th edition of SELSE. Together with Intel’s Helia Naeimi, Dan Alexandrescu is the General Co-Chair of this year’s SELSE. The growing complexity and shrinking geometries of modern manufacturing technologies are making high-density, low-voltage devices increasingly susceptible to the influences of electrical noise, process […]

Read more

Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems – March 18th 2016 – Dresden, Germany

IROC is co-organizing the ERMAVSS Workshop. Together with  Stefano di Carlo (Politecnico di Torino – IT), Praveen Raghavan (IMEC – BE) and Dimitris Gizopoulos (University of Athens – GR), IROC’s Adrian Evans is the General Chair Co-Chair With the proliferation of integrated circuits implemented in the most advanced process technologies, […]

Read more

Computing Now – Are Our Electronic Circuits Getting Older? – September 2015

Link to Computer.org Enabling Lifetime Performance – by Dan Alexandrescu There are many interesting challenges associated to the aging of semiconductor devices. The industry and its R&D partners needs a very good understanding of the phenomena, the supporting EDA infrastructure and efficient solutions to implement advanced self-tuning […]

Read more