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IROC at DAC

IROC is excited to showcase its products, technologies and services at the 53rd Design Automation Conference in Austin. Come by and meet us at booth 1638 to find out about our radiation test services and to learn about the latest advances in our reliability tools (TFIT and […]

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SELSE-12: The 12th Workshop on Silicon Errors in Logic – System Effects – March 29 – March 30, 2016 – Austin TX

IROC is sponsoring the 12th edition of SELSE. Together with Intel’s Helia Naeimi, Dan Alexandrescu is the General Co-Chair of this year’s SELSE. The growing complexity and shrinking geometries of modern manufacturing technologies are making high-density, low-voltage devices increasingly susceptible to the influences of electrical noise, process […]

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IEEE International Reliability Innovation Conference – March 17, 2016, San Jose, CA

IROC sponsors and contributes to IEEE IRIC. Radiation Effects in Solid State Drives Enrico Costenaro, Dan Alexandrescu, Adrian Evans, Maximilien Glorieux, Olivier Lauzeral Abstract Solid state drives (SSD) are used to store highly critical data in cloud and HPC applications. Silent data corruption (SDC) is a serious concern […]

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Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems – March 18th 2016 – Dresden, Germany

IROC is co-organizing the ERMAVSS Workshop. Together with  Stefano di Carlo (Politecnico di Torino – IT), Praveen Raghavan (IMEC – BE) and Dimitris Gizopoulos (University of Athens – GR), IROC’s Adrian Evans is the General Chair Co-Chair With the proliferation of integrated circuits implemented in the most advanced process technologies, […]

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