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Archive for the Events Category

26th IEEE International Symposium on On-Line Testing and Robust System Design

IROC is proud to contribute to the organization of this year’s IOLTS – 26th IEEE International Symposium on On-Line Testing and Robust System Design. IOLTS is an established forum for presenting novel ideas and experimental data related to the topic of testing, reliability and functional safety of complex […]

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ESA Awards Contract to IROC to Select Space Technologies

Following a competitive bidding process, IROC has been selected by the European Space Agency to carry out the project “Definition of Radiation Effects Mitigation Techniques for Ultra-Deep Submicron Technologies”. This activity intends to assess the suitability of Ultra Deep Submicron (UDSM) technology nodes below 22nm for space […]

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The International Symposium on On-Line Testing and Robust System Design (IOLTS), is an established forum for presenting novel ideas and experimental data on these areas. Together with Dimitris Gizopoulos from the University of Athens, IROC’s Dan Alexandrescu and Adrian Evans contributed to the organisation of the technical program […]

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Extending UVM Verification Models for the Analysis of Fault Injection Simulations

In high-reliability and safety-critical applications, RT and gate-level fault-injection simulations are often performed in order to ensure a certain level of fault detection coverage which is necessary to ensure compliance with standards such as ISO 26262. There are many techniques available for accelerating the simulations including emulation […]

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DAC 2016 Minalogic Showcase: Spotlight on the EDA innovators in France

DAC 2016 Minalogic Showcase: Spotlight on the French EDA innovators For the second year, Minalogic will follow 7 french SMEs at DAC. The most important event in the world dedicated to microelectronic design will be held from the June 5th to 9th in Austin Texas. Minalogic will […]

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From July 12th to 15th, IROC will be participating  presenting an oral paper at the NSREC conference in Portland Oregon. Maximilien Glorieux will present a joint paper with ST Micro Electronics titled “Detailed SET Measurement and Characterization of a 65 nm Bulk Technology” which highlights advanced techniques for […]

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System-to-Silicon Performance Modeling and Analysis Workshop at DAC

IROC will be participating in the System-to-Silicon Performance Modeling and Analysis – Power, Temperature and Reliability workshop at DAC, in Austin on Sunday June 5th. Come hear our talk on “Modeling of Variability and Aging Effects Across Abstraction Layers” including the latest updates from the MoRV FP7 Research Project.

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IROC at SEE Symposium / MAPLD

IROC will participating in the SEE Symposium MAPLD on May 23rd in La Jolla, California. During a keynote talk by Adrian Evans, we will present the results of a detailed study of Single Event Transients (SETs) in a 65nm space technology, including novel new techniques for measuring […]

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IROC is excited to showcase its products, technologies and services at the 53rd Design Automation Conference in Austin. Come by and meet us at booth 1638 to find out about our radiation test services and to learn about the latest advances in our reliability tools (TFIT and […]

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SELSE-12: The 12th Workshop on Silicon Errors in Logic – System Effects – March 29 – March 30, 2016 – Austin TX

IROC is sponsoring the 12th edition of SELSE. Together with Intel’s Helia Naeimi, Dan Alexandrescu is the General Co-Chair of this year’s SELSE. The growing complexity and shrinking geometries of modern manufacturing technologies are making high-density, low-voltage devices increasingly susceptible to the influences of electrical noise, process […]

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