Your Functional Reliability Partner – IROC Technologies
+33 438 120 763 (FR)
+1 408 982 9993 (US)
info@iroctech.com
Contact Us
Support Site

Archive for the Events Category

IOLTS – 27th IEEE International Symposium on On-Line Testing and Robust System Design

IROC is proud to contribute to the organization of this year’s IOLTS – 27th IEEE International Symposium on On-Line Testing and Robust System Design. IOLTS is an established forum for presenting novel ideas and experimental data related to the topic of testing, reliability and functional safety of complex […]

Read more

SHARC-FIN Tapeout Successful!

We are very pleased to announce that our FinFET SHARC-FIN ASIC has been successfully taped-out and it’s currently in manufacturing. SHARC-FIN stands for SEE Hardening And Radiation Characterization of FINfet Technologies and it’s a complete solution for the study of Single Event Effects (SEE) in advanced processes. […]

Read more

IROC in Samsung’s Advanced Foundry Ecosystem (SAFE)

Samsung welcomed IROC as the EDA provider of Soft-Error-Rate (SER) / Transient Fault tools and solutions for it’s SAFE (Samsung Advanced Foundry Ecosystem) program. We are very honored to be a part of Samsung’s ecosystem and we welcome the opportunity to contribute to the functional safety and […]

Read more

IROC’s test team @ LANSCE, USA

IROC’s test teams are currently executing an extensive test campaign at the Los Alamos Neutron Science Center (LANSCE) Our deepest appreciation and thanks go to the US Embassy in Paris who made possible this trip and to our colleagues and partners in LANSCE who welcomed our team in these […]

Read more

26th IEEE International Symposium on On-Line Testing and Robust System Design

IROC is proud to contribute to the organization of this year’s IOLTS – 26th IEEE International Symposium on On-Line Testing and Robust System Design. IOLTS is an established forum for presenting novel ideas and experimental data related to the topic of testing, reliability and functional safety of complex […]

Read more

ESA Awards Contract to IROC to Select Space Technologies

Following a competitive bidding process, IROC has been selected by the European Space Agency to carry out the project “Definition of Radiation Effects Mitigation Techniques for Ultra-Deep Submicron Technologies”. This activity intends to assess the suitability of Ultra Deep Submicron (UDSM) technology nodes below 22nm for space […]

Read more

IROC @ IOLTS 2016

The International Symposium on On-Line Testing and Robust System Design (IOLTS), is an established forum for presenting novel ideas and experimental data on these areas. Together with Dimitris Gizopoulos from the University of Athens, IROC’s Dan Alexandrescu and Adrian Evans contributed to the organisation of the technical program […]

Read more

Extending UVM Verification Models for the Analysis of Fault Injection Simulations

In high-reliability and safety-critical applications, RT and gate-level fault-injection simulations are often performed in order to ensure a certain level of fault detection coverage which is necessary to ensure compliance with standards such as ISO 26262. There are many techniques available for accelerating the simulations including emulation […]

Read more

DAC 2016 Minalogic Showcase: Spotlight on the EDA innovators in France

DAC 2016 Minalogic Showcase: Spotlight on the French EDA innovators For the second year, Minalogic will follow 7 french SMEs at DAC. The most important event in the world dedicated to microelectronic design will be held from the June 5th to 9th in Austin Texas. Minalogic will […]

Read more

IROC at NSREC

From July 12th to 15th, IROC will be participating  presenting an oral paper at the NSREC conference in Portland Oregon. Maximilien Glorieux will present a joint paper with ST Micro Electronics titled “Detailed SET Measurement and Characterization of a 65 nm Bulk Technology” which highlights advanced techniques for […]

Read more
Page 1 of 212