TEST SOLUTIONS

iRoC provides Turn key Solution for Alpha Particles counting and Radiation Testing from whole systems (mother board, whole device) to your stand alone component including memories, ASICs, FPGAs, FF. Our services help customers to:

  • Measure the alpha emission of wafers, parts and packaging
  • Qualify your devices to SER specs
  • Get access to test labs on time to meet your production shipment schedule constraints
  • Analyze nuclear interaction and bring test expertise to your design team

Alpha Emission measurement is performed in our lab in Grenoble, or in our partner’s lab in California. Both use the same detector, therefore results are comparable. The alpha emission results will be used as an input to the calculation of FIT rate from SER accelerated test.


iRoC uses the most appropriate facilities worldwide for the accelerated test according to the radiation-induced failure mechanism: white spectrum neutron, mono-energy neutron beam, high or low flux, alpha particles or thermal neutrons, real time testing, X ray testing, gamma ray testing. Our teams of expert will run preliminary analysis of your device and determine the best Design Of Experiment.

Test offering


iRoC offers two families of test:

  • 1.Measurement of the alpha particle emission rate of any material of the packaging, as well as the wafer (up to 300mm diameter) and finished good. The result in a rate of alpha particles per hour and per cm2.
  • 2. Measurement of the failure rate of the design (FIT rate).

      • For this second family, we offer three types of test:

    • System test to check the MTBF of a whole system board or device, when positioned partially or completely in front of an accelerated source of particles
    • Real time test where detection of errors is performed on a large number of chips (several hundreds), during a long period (several months). Only natural radiation (non accelerated) in used here.
    • Accelerated test using artificial particles sources (neutrons, protons, heavy ions, alpha, gamma), as well as X-ray tests specific for DRAM


      • Which Test For Which Particle?

        System Testing Real-Time Accelerated
      Environment Particles   X  
      White spectrum Neutrons X   X
      Mono-Energy Neutrons X   X
      Thermal Neutrons X   X
      Heavy Ions     X
      Protons     X
      Alpha     X
      Gamma     X


      Which Test For Which SE Effect?

        System Testing Real-Time Accelerated
      SEU X X X
      MBU/MCU X X X
      SEL X X(*) X
      SEFI   X(*) X
      Snapback     X
      (*): not likely to occur


      For the definition of SE effect, go to Soft Error FAQ page