TEST SERVICES

iRoC Technologies provides turn key solution for Alpha Particles counting and radiation testing from whole systems (mother board, device) to stand alone components including memories, ASICs, FPGAs, FF and packaging materials. Our test services help customers to:

  • Qualify devices to Soft Error Rate (SER) specs
  • Get access to test labs on time to meet production shipment schedule constraints
  • Perform radiation test campaigns delivering results with high accuracy and meaningful data.
  • Measure the alpha emission of wafers, parts and packaging

    • Useful link Jedec Standard: (JESD 89A)

iRoC uses the most appropriate testing facilities worldwide for the accelerated test according to the radiation-induced failure mechanism: white spectrum neutron, mono-energy neutron beam, high or low flux, alpha particles or thermal neutrons, real time testing, X ray testing, gamma ray testing. Our teams of expert will run preliminary analysis of your device and determine the best Design Of Experiment.

Alpha Emission measurement is performed in our lab in Grenoble, or in our partner’s lab in California. Both use the same detector, therefore results are comparable. The alpha emission results is used as an input to the calculation of Failure in Time (FIT) rate from SER accelerated test.

(click on buttons on the image below for more info)

Alpha Counting Accelerated Testing System Test

iRoC is your trusted advisor for the following:

  1. ALPHA COUNTING for PACKAGING MATERIALS = Measurement of the alpha particle emission rate of any material of the packaging, as well as the wafer (up to 300mm diameter) and finished good. The result is a rate of alpha particles per hour and per cm2.
  1. RADIATION TEST for COMPONENTS AND SYSTEMS = Measurement of the Failure In Time rate of the design (FIT rate).
    1. Accelerated test using artificial particles sources (neutrons, protons, heavy ions, alpha, gamma), as well as X-ray tests specific for DRAM
    2. Real time test where detection of errors is performed on a large number of chips (several hundreds), during a long period of time (several months). Only natural radiation (non accelerated) is used here.
    3. System test to check the MTBF of a whole system board or device, when positioned partially or completely in front of an accelerated source of particles

    Which Test For Which Particle?

      System Testing Real-Time Accelerated
    Environment Particles   X  
    White spectrum Neutrons X   X
    Mono-Energy Neutrons X   X
    Thermal Neutrons X   X
    Heavy Ions     X
    Protons     X
    Alpha     X
    Gamma     X


    Which Test For Which SE Effect?

      System Testing Real-Time Accelerated
    Single Event Upset (SEU) X X X
    MBU/MCU X X X
    Single Event Latchup (SEL) X X(*) X
    SEFI   X(*) X
    Snapback     X
    (*): not likely to occur


    For the definition of Single Event effect, go to Soft Error FAQ page