Cell Level Soft Error Analysis
Assess Soft Error Risk During Design

Targeting the need of cell designers to improve Soft Error Rate (SER), TFIT main attributes are:

  • Guaranty of good correlation with test results
  • Identification of relevant layout parameters for SER improvement
  • Quick and exhaustive SER analysis for almost any type of cell and particle (including neutrons)
  • Ease of use for non specialists

    • This offer is available both as a stand alone EDA tool and as a service run by iRoC experts.

    TFIT is a fast simulation tool which is used to predict and improve the SER and the FIT performance of cells design before production. TFIT performs accurate calculation of the electrical effect of particles impact to a transistor, a cell, or a circuit early in the design flow, at much faster speed than traditional 3D TCAD simulations. TFIT interfaces with Spice simulators so the electrical impact of the particle on a transistor is analyzed on a whole cell or circuit. Particles can be either neutrons (cosmic rays), alpha particles or heavy ions.

    T-FIT KEY BENEFITS

    T-FIT is a unique simulation tool that offers unmatched advantages over the traditional 3D TCAD simulation method for determining FIT rate in a cell:

    TFIT benefits

    T-FIT ARCHITECTURE

    TFIT simulates the particles electrical impacts at the transistors .Its inputs are the SPICE netlist and layout of the impacted circuit, the transistor spice model and configuration data to guide the TFIT flow and mode of computation.

    TFIT users need a process-dependent response model to automatically generate particle impact effects at the transistor, depending on location of impact, type of particle (neutron, heavy ion) and technology node. The response model is usually provided by foundries.

    In case of a neutron impact, a nuclear database is used by TFIT to compute the FIT of the cell (Failure In time). The database describes the interactions between neutrons and the nuclei found in the sensitive volume of the transistors.

    Depending on the execution mode and the particle (including heavy ions, neutrons, alpha particles), TFIT produces the following:

    • Single particle effects (SEU (Single Event Upset), SET (Single Event Transient) and Electrical waveforms)
    • cross section
    • The SEU FIT
    • The MCU (Multi Cell Upset) FIT
    • The MCU patterns

      • TFIT flow